HomeSearchAnnual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Annual Report - Conference on Electrical Insulation and Dielectric Phenomena, CEIDP

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN0084-9162
SJR -Scopus / SJR
0
/ 100
High Risk
Score Breakdown
No verified metrics
Total0
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Score
0.156
H-Index
43
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
-
SJR Rank
Bottom 25%

General Information

Country / RegionUnited States
Primary Language
1st Year Published
StatusActive
Total Publications

Submission Info

Peer Review
Review Time
Acceptance Rate
OA License
OA Rate

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

4/12 · 33%
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
Does the journal have a website?
No URL
Is the ISSN verified?
0084-9162
Indexed in a trusted database?
Scopus
Peer review process documented?
N/A
Follows ethical publishing standards (COPE)?
N/A
APC fees clearly disclosed?
N/A
Not on predatory/blacklists?
✓ Clean
Long-term digital preservation?
N/A
Plagiarism detection in place?
N/A
Listed in DOAJ (verified OA)?
N/A
Primary language documented?
N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Building and ConstructionUnranked
Electrical and Electronic EngineeringUnranked
Electronic, Optical and Magnetic MaterialsUnranked
Engineering (miscellaneous)Unranked
Industrial and Manufacturing EngineeringUnranked

Subject Classification

Scopus Categories

Industrial and Manufacturing EngineeringBuilding and ConstructionEngineering (miscellaneous)Electrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
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Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref