Home›Search›NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
ELSEVIER · NL
ISSN0168-583XeISSN1872-9584
✓ WOS SCIE
25
/ 100
High Risk
Score Breakdown
✓ WoS SCIE/SSCI+25
Total25
Journal Impact Factor
This journal is indexed in Web of Science (JCR) and has an official Journal Impact Factor. View the current value on the journal’s page ↗
SNIP
0.854
Aims & Scope✦ Compiled from public sources
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms focuses on the fundamental physics and technical development of materials analysis using energetic beams. This includes ion beam analysis, accelerator mass spectrometry, positron annihilation spectroscopy, neutron scattering and diffraction, and synchrotron-based methods.
AI-compiled from public web sources · verify on publisher page →
General Information
Country / RegionNL
Primary LanguageEnglish
1st Year Published—
StatusActive
Total Publications—
Publisher OrgElsevier BV
Submission Info
Peer Review—
Review Time—
Acceptance Rate—
OA License—
OA Rate—
Ethics & Quality
COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes
Think.Check.Submit Compliance
6/12 · 50%
✅
Do you know the journal / publisher?
✅
Does the journal have a website?
✅
Is the ISSN verified?
✅
Indexed in a trusted database?
❌
Peer review process documented?
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Follows ethical publishing standards (COPE)?
❌
APC fees clearly disclosed?
✅
Not on predatory/blacklists?
❌
Long-term digital preservation?
❌
Plagiarism detection in place?
❌
Listed in DOAJ (verified OA)?
✅
Primary language documented?
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
Subject Classification
Web of Science Categories
Instruments & InstrumentationNuclear Science & TechnologyPhysics, Atomic, Molecular & ChemicalPhysics, Nuclear
Research Topics (OpenAlex)
Ion-surface interactions and analysisNuclear Physics and ApplicationsX-ray Spectroscopy and Fluorescence AnalysisElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure AnalysisAtomic and Molecular PhysicsSemiconductor materials and devicesDiamond and Carbon-based Materials ResearchSilicon and Solar Cell TechnologiesMetal and Thin Film Mechanics
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See all →Data updated: 2026-05-26 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref