HomeSearchConference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN0197-2618
Scopus / SJR
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Scorei
0.219
H-Indexi
41
Total Worksi
940
Total Citationsi
10,594
2yr Mean Citednessi
0.00
Open Impact Factor alternative

Aims & Scope

Subject areas: Control and Systems Engineering; Electrical and Electronic Engineering; Industrial and Manufacturing Engineering.

General Information

Country / RegionUnited States
Primary Language
1st Year Published
Annual Volume~ 470 articles / year
StatusActive
Total Publications940
Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Publishing ModelSubscription
Peer Review
OA License
OA Rate

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

4/11 · 36%
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
Does the journal have a website?
No URL
Is the ISSN verified?
0197-2618
Indexed in a trusted database?
Scopus
Peer review process documented?
N/A
Follows ethical publishing standards (COPE)?
N/A
Not on predatory/blacklists?
✓ Clean
Long-term digital preservation?
N/A
Plagiarism detection in place?
N/A
Listed in DOAJ (verified OA)?
N/A
Primary language documented?
N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Control and Systems EngineeringUnranked
Electrical and Electronic EngineeringUnranked
Industrial and Manufacturing EngineeringUnranked

Subject Classification

Scopus Categories

Industrial and Manufacturing EngineeringElectrical and Electronic EngineeringControl and Systems Engineering

Research Topics (OpenAlex)

Electric Motor Design and AnalysisMultilevel Inverters and ConvertersSensorless Control of Electric MotorsAdvanced DC-DC ConvertersMagnetic Bearings and Levitation DynamicsSilicon Carbide Semiconductor TechnologiesMicrogrid Control and OptimizationMagnetic Properties and ApplicationsInduction Heating and Inverter TechnologyElectromagnetic Compatibility and Noise Suppression

Frequently asked questions about Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Is Conference Record - IAS Annual Meeting (IEEE Industry Applications Society) a predatory journal?

PubScope has no integrity flags on record for Conference Record - IAS Annual Meeting (IEEE Industry Applications Society): it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)?

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society) is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.219.

Is Conference Record - IAS Annual Meeting (IEEE Industry Applications Society) indexed in Scopus and Web of Science?

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society) is indexed in Scopus.

What is the aims and scope of Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)?

Subject areas: Control and Systems Engineering; Electrical and Electronic Engineering; Industrial and Manufacturing Engineering.

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How to tell if a journal is predatoryWhat Q1–Q4 quartiles meanWeb of Science vs Scopus vs DOAJWhat is an APC?

Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref