Home›Search›Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument
Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument
Science Press · China
ISSN0254-3087
SJR Q3✓ Scopus / SJR
12
/ 100
High Risk
Score Breakdown
✓ Scopus Q3+12
Total12
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Score
0.267
H-Index
7
SNIP
0.571
Total Works
300
Total Citations
258
2yr Mean Citedness
0.00
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Aims & Scope✦ Inferred from recent articles
This journal focuses on the development and application of scientific instruments and measurement technologies. Articles cover non-contact temperature measurement using infrared thermal imaging, automated detection and segmentation of industrial components like cigarette filters, and inspection techniques for infrastructure such as high-speed railway rails. It also includes research on video analysis for shot boundary detection, precise time-difference measurement systems, fault diagnosis in mechanical systems like bevel gears, calibration devices for vehicle maintenance, and optimization methods for computational pipelines.
AI-summarised from recent articles · verify on the publisher page
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
Publication & Citation Trend
Articles published
Times cited
2012
2013
2014
2015
2016
2017
2019
2020
Source: OpenAlex · Note: citations accumulate over time so older years appear higher
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
InstrumentationQ3
Subject Classification
Scopus Categories
Instrumentation
Research Topics (OpenAlex)
Advanced Sensor and Control SystemsAdvanced Computational Techniques and ApplicationsAdvanced Algorithms and ApplicationsIndustrial Technology and Control SystemsAdvanced Measurement and Detection MethodsEmbedded Systems and FPGA DesignAdvanced Decision-Making TechniquesSensor Technology and Measurement SystemsAdvanced Measurement and Metrology TechniquesEngineering and Test Systems