Home›Search›Conference Proceedings from the International Symposium for Testing and Failure Analysis

Conference Proceedings from the International Symposium for Testing and Failure Analysis

ASM International · United States

ISSN0890-1740

SJR -✓ Scopus / SJR

/ 100

High Risk

Score Breakdown

No verified metrics

Total0

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

H-Index

Total Works

2,723

Total Citations

5,104

2yr Mean Citedness

0.08

Free JIF alternative

Aims & Scope✦ Inferred from recent articles

This journal focuses on failure analysis (FA) and testing methodologies for semiconductor devices and integrated circuits. It covers techniques for identifying and localizing defects, analyzing material properties at the nanoscale, and improving device reliability. The scope includes advanced packaging, 3D integration, power electronics, and hardware security evaluations. Methodologies discussed involve electron microscopy, X-ray microscopy, atomic force microscopy, thermal imaging, and artificial intelligence applications in FA.

AI-summarised from recent articles · verify on the publisher page

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

SJR Rank

Bottom 25%

General Information

Country / RegionUnited States

Primary Language—

1st Year Published—

Annual Volume~ 126 articles / year

StatusActive

Total Publications2,723

Submission Info

Publishing ModelSubscription

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

ASM International

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

0890-1740

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Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

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Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published

Times cited

2018

2019

2020

2021

2022

2023

2024

2025

Source: OpenAlex · Note: citations accumulate over time so older years appear higher

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Control and Systems EngineeringUnranked

Electrical and Electronic EngineeringUnranked

Safety, Risk, Reliability and QualityUnranked

Subject Classification

Scopus Categories

Electrical and Electronic EngineeringControl and Systems EngineeringSafety, Risk, Reliability and Quality

Research Topics (OpenAlex)

Integrated Circuits and Semiconductor Failure AnalysisElectron and X-Ray Spectroscopy TechniquesSemiconductor materials and devicesVLSI and Analog Circuit TestingIndustrial Vision Systems and Defect Detection