This journal publishes reference spectra and detailed instrumental characterizations for surface analysis techniques. It focuses on materials such as polymers, semiconductors, oxides, and metals, utilizing methods like X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). The scope includes providing spectral data and instrumental context to support accurate referencing and interpretation in scientific publications.
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Publication & Citation Trend
Articles published
Times cited
2019
2020
2021
2022
2023
2024
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2026
Source: OpenAlex · Note: citations accumulate over time so older years appear higher
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Condensed Matter PhysicsQ2
Surfaces, Coatings and FilmsQ2
Surfaces and InterfacesQ3
Subject Classification
Web of Science Categories
Physics, Condensed Matter
Scopus Categories
Condensed Matter PhysicsSurfaces and InterfacesSurfaces, Coatings and Films
Research Topics (OpenAlex)
Electron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence AnalysisIon-surface interactions and analysisSemiconductor materials and devicesElectronic and Structural Properties of Oxides