Home›Search›Proceedings of the Asian Test Symposium

Proceedings of the Asian Test Symposium

IEEE Computer Society · United States

ISSN1081-7735

✓ Scopus / SJR

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.18

H-Indexi

Total Worksi

158

Total Citationsi

493

2yr Mean Citednessi

0.00

Open Impact Factor alternative

Aims & Scope

Subject areas: Electrical and Electronic Engineering.

General Information

Country / RegionUnited States

Primary Language—

1st Year Published—

Annual Volume~ 79 articles / year

StatusActive

Total Publications158

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Publishing ModelSubscription

Peer Review—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/11 · 36%

✅

Do you know the journal / publisher?

IEEE Computer Society

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

1081-7735

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

Subject Classification

Scopus Categories

Electrical and Electronic Engineering

Research Topics (OpenAlex)

VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test SystemsRadiation Effects in ElectronicsSoftware Testing and Debugging TechniquesVLSI and FPGA Design TechniquesEmbedded Systems Design TechniquesAdvancements in PLL and VCO TechnologiesPhysical Unclonable Functions (PUFs) and Hardware SecuritySemiconductor materials and devices

Frequently asked questions about Proceedings of the Asian Test Symposium

Is Proceedings of the Asian Test Symposium a predatory journal?

PubScope has no integrity flags on record for Proceedings of the Asian Test Symposium: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of Proceedings of the Asian Test Symposium?

Proceedings of the Asian Test Symposium is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.18.

Is Proceedings of the Asian Test Symposium indexed in Scopus and Web of Science?

Proceedings of the Asian Test Symposium is indexed in Scopus.

What is the aims and scope of Proceedings of the Asian Test Symposium?