HomeSearchIEEE Transactions on Reliability

IEEE Transactions on Reliability

Institute of Electrical and Electronics Engineers Inc. · United States · Est. 1878

ISSN1558-1721
SJR Q1WOS SCIEScopus / SJR
Impact Factor & Quartile · Web of Science (JCR)

✓ Indexed in the Web of Science Core Collection (SCIE) — Clarivate publishes an official Journal Impact Factor and JCR quartile for this journal.

See the official Impact Factor & quartile on the journal’s page ↗

The Impact Factor & JCR quartile are licensed by Clarivate — we link you to the official source instead of reprinting a number that can go out of date. Open metrics below: SCImago Q1 · Scopus CiteScore 11.6. Source: Clarivate Journal Citation Reports.

📊 Standing in its field
Where this journal ranks among others in the same subject area.
Q1
SJR · Scopus
Top 25% in field
Clarivate’s JCR quartile is a separate ranking and may differ
SJR Scorei
1.16
H-Indexi
162
CiteScorei
11.6
SNIPi
1.973
Total Worksi
8,150
Total Citationsi
183,687
2yr Mean Citednessi
3.71
Open Impact Factor alternative

Aims & Scope

IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to ways of predicting and measuring behavior in the field. As an engineering subject that supports new and existing technologies, we constantly expand into new areas of the assurance sciences.

General Information

Country / RegionUnited States
Primary LanguageEnglish
1st Year Published1878
FrequencyQuarterly, <1999- >
StatusActive (last: 2026)
Total Publications8,150
Publisher OrgInstitute of Electrical and Electronics Engineers
Visit Journal Website

Submission Info

Peer Reviewsingle and/or double anonymous
OA License
OA Rate

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes
Plagiarism Detection✓ Yes

Think.Check.Submit Compliance

8/11 · 73%
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
Does the journal have a website?
✓ Linked
Is the ISSN verified?
1558-1721
Indexed in a trusted database?
WoS, Scopus
Peer review process documented?
single and/or double anonymous
Follows ethical publishing standards (COPE)?
N/A
Not on predatory/blacklists?
✓ Clean
Long-term digital preservation?
N/A
Plagiarism detection in place?
Yes
Listed in DOAJ (verified OA)?
N/A
Primary language documented?
English

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published
Citations received
162
5k
2019
105
3k
2020
131
3.4k
2021
164
4.4k
2022
159
2.4k
2023
210
2k
2024
201
834
2025
216
126
2026

Source: OpenAlex · Each year’s green bar = citations earned by that year’s papers, counted to date — so recent years look lower simply because their papers haven’t had time to be cited yet.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringQ1
Safety, Risk, Reliability and QualityQ1

Subject Classification

Web of Science Categories

Computer Science, Hardware & ArchitectureComputer Science, Software EngineeringEngineering, Electrical & Electronic

Scopus Categories

Electrical and Electronic EngineeringSafety, Risk, Reliability and Quality

Research Topics (OpenAlex)

Reliability and Maintenance OptimizationSoftware Reliability and Analysis ResearchStatistical Distribution Estimation and ApplicationsProbabilistic and Robust Engineering DesignRisk and Safety AnalysisDiverse Scientific and Economic StudiesHuman auditory perception and evaluationPower System Reliability and MaintenanceFault Detection and Control SystemsSoftware Engineering Research

Frequently asked questions about IEEE Transactions on Reliability

Is IEEE Transactions on Reliability a predatory journal?

PubScope has no integrity flags on record for IEEE Transactions on Reliability: it is indexed in Web of Science, Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of IEEE Transactions on Reliability?

IEEE Transactions on Reliability is indexed in the Web of Science Core Collection, so Clarivate publishes an official Journal Impact Factor for it (since the 2023 Journal Citation Reports, every Core Collection journal — including Arts & Humanities and Emerging Sources titles — receives one). PubScope links to Clarivate's official source rather than reprinting the number, which can be out of date. As an open alternative, its Scopus CiteScore is 11.6.

Is IEEE Transactions on Reliability indexed in Scopus and Web of Science?

IEEE Transactions on Reliability is indexed in Web of Science, Scopus.

What is the aims and scope of IEEE Transactions on Reliability?

IEEE Transactions on Reliability is a refereed journal for the reliability and allied disciplines including, but not limited to, maintainability, physics of failure, life testing, prognostics, design and manufacture for reliability, reliability for systems of systems, network availability, mission success, warranty, safety, and various measures of effectiveness. Topics eligible for publication range from hardware to software, from materials to systems, from consumer and industrial devices to manufacturing plants, from individual items to networks, from techniques for making things better to wa

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Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref