Scanning
John Wiley and Sons Inc · United States · Est. 1976
ISSN1932-8745
SJR Q2✓ Scopus / SJR
28
/ 100
High Risk
Score Breakdown
✓ Scopus Q2+18
Total28
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals. If this journal has one, it appears on the journal’s page ↗
SJR Score
0.571
H-Index
75
CiteScore
View ↗
Scopus metric · on the journal’s page
Total Works
2,784
Total Citations
39,092
2yr Mean Citedness
0.00
Free JIF alternative
Retractions
87
Source: Retraction Watch
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
Q2
SJR Rank
Top 50% in field
General Information
Country / RegionUnited States
Primary Language—
1st Year Published1976
Annual Volume~ 90 articles / year
StatusActive (last: 2023)
Total Publications2,784
Publisher OrgWiley
Submission Info
Peer Review—
Review Time—
Acceptance Rate—
OA License—
OA Rate—
Ethics & Quality
COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes
Think.Check.Submit Compliance
5/12 · 42%
✅
Do you know the journal / publisher?
✅
Does the journal have a website?
✅
Is the ISSN verified?
✅
Indexed in a trusted database?
❌
Peer review process documented?
❌
Follows ethical publishing standards (COPE)?
❌
APC fees clearly disclosed?
✅
Not on predatory/blacklists?
❌
Long-term digital preservation?
❌
Plagiarism detection in place?
❌
Listed in DOAJ (verified OA)?
❌
Primary language documented?
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
Publication & Citation Trend
Articles published
Times cited
2016
2017
2018
2019
2020
2021
2022
2023
Source: OpenAlex · Note: citations accumulate over time so older years appear higher
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Atomic and Molecular Physics, and OpticsQ2
InstrumentationQ2
Subject Classification
Scopus Categories
Atomic and Molecular Physics, and OpticsInstrumentation
Research Topics (OpenAlex)
Electron and X-Ray Spectroscopy TechniquesAdvancements in Photolithography TechniquesAdvanced Electron Microscopy Techniques and ApplicationsForce Microscopy Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure AnalysisDental materials and restorationsApplied Advanced TechnologiesX-ray Spectroscopy and Fluorescence AnalysisEndodontics and Root Canal TreatmentsDiverse Scientific and Economic Studies
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See all →Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref