Homeβ€ΊSearchβ€ΊIEEE International Conference on Emerging Technologies and Factory Automation, ETFA

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

Institute of Electrical and Electronics Engineers Inc. Β· United States

ISSN1946-0759
βœ“ Scopus / SJR
52
/ 100
Established
PubScope credibility score from verifiable indexing & ethics signals
Score Breakdown
β—† Norwegian Register Level 152
Total52
Level data: Norwegian Register (HK-dir), NLOD 2.0. Β· Third-party records Β· how this is calculated Β· Report an error β†’
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Scorei
0.306
H-Indexi
57
SNIPi
0.698

Aims & Scope✦ Compiled from public sources

The IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) brings together experts from industry and academia to discuss novel ideas, emerging trends, research results, and practical achievements in industrial and factory automation. The conference aims to foster the development and adoption of scientific methods, models, and tools for the efficient design and operation of industrial and factory systems.

AI-compiled from public web sources Β· verify on the publisher page

General Information

Country / RegionUnited States
Primary Languageβ€”
1st Year Publishedβ€”
StatusActive
Total Publicationsβ€”

Submission Info

Peer Reviewβ€”
Review Timeβ€”
Acceptance Rateβ€”
OA Licenseβ€”
OA Rateβ€”

Ethics & Quality

COPE Memberβœ— No
OASPA Memberβœ— No
Not on Predatory Listsβœ“ Yes

Think.Check.Submit Compliance

4/12 Β· 33%
βœ…
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
❌
Does the journal have a website?
No URL
βœ…
Is the ISSN verified?
1946-0759
βœ…
Indexed in a trusted database?
Scopus
❌
Peer review process documented?
N/A
❌
Follows ethical publishing standards (COPE)?
N/A
❌
APC fees clearly disclosed?
N/A
βœ…
Not on predatory/blacklists?
βœ“ Clean
❌
Long-term digital preservation?
N/A
❌
Plagiarism detection in place?
N/A
❌
Listed in DOAJ (verified OA)?
N/A
❌
Primary language documented?
N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category β€” its quartile can differ by discipline.

Computer Science ApplicationsUnranked
Control and Systems EngineeringUnranked
Electrical and Electronic EngineeringUnranked
Engineering (miscellaneous)Unranked
Industrial and Manufacturing EngineeringUnranked

Subject Classification

Scopus Categories

Industrial and Manufacturing EngineeringComputer Science ApplicationsEngineering (miscellaneous)Electrical and Electronic EngineeringControl and Systems Engineering

Frequently asked questions about IEEE International Conference on Emerging Technologies and Factory Automation, ETFA

Is IEEE International Conference on Emerging Technologies and Factory Automation, ETFA a predatory journal?

PubScope has no integrity flags on record for IEEE International Conference on Emerging Technologies and Factory Automation, ETFA: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Its PubScope Trust Score is 52/100. Indexing is a transparency signal, not a guarantee β€” always confirm fit and policies before submitting.

What is the impact factor of IEEE International Conference on Emerging Technologies and Factory Automation, ETFA?

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.306.

Is IEEE International Conference on Emerging Technologies and Factory Automation, ETFA indexed in Scopus and Web of Science?

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA is indexed in Scopus.

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How to tell if a journal is predatoryWhat Q1–Q4 quartiles meanWeb of Science vs Scopus vs DOAJWhat is an APC?

Data updated: 2026-05-22 Β· Sources: SJR, DOAJ, OpenAlex, WoS, Crossref