Home›Search›International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN1946-1577
SJR -✓ Scopus / SJR
0
/ 100
High Risk
PubScope credibility score from verifiable indexing & ethics signals
Score Breakdown
No verified metrics
Total0
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
H-Indexi
2

Aims & Scope

Subject areas: Computer Science Applications; Electrical and Electronic Engineering; Modeling and Simulation.

⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
-
SJR Rank
Bottom 25%

General Information

Country / RegionUnited States
Primary Language—
1st Year Published—
StatusActive
Total Publications—

Submission Info

Peer Review—
Review Time—
Acceptance Rate—
OA License—
OA Rate—

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

4/12 · 33%
✅
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
❌
Does the journal have a website?
No URL
✅
Is the ISSN verified?
1946-1577
✅
Indexed in a trusted database?
Scopus
❌
Peer review process documented?
N/A
❌
Follows ethical publishing standards (COPE)?
N/A
❌
APC fees clearly disclosed?
N/A
✅
Not on predatory/blacklists?
✓ Clean
❌
Long-term digital preservation?
N/A
❌
Plagiarism detection in place?
N/A
❌
Listed in DOAJ (verified OA)?
N/A
❌
Primary language documented?
N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Computer Science ApplicationsUnranked
Electrical and Electronic EngineeringUnranked
Modeling and SimulationUnranked

Subject Classification

Scopus Categories

Computer Science ApplicationsElectrical and Electronic EngineeringModeling and Simulation

Frequently asked questions about International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Is International Conference on Simulation of Semiconductor Processes and Devices, SISPAD a predatory journal?

No major predatory indicators were found for International Conference on Simulation of Semiconductor Processes and Devices, SISPAD. It is indexed in Scopus and has a PubScope Trust Score of 0/100. Always confirm fit and policies before submitting.

What is the impact factor of International Conference on Simulation of Semiconductor Processes and Devices, SISPAD?

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor.

Is International Conference on Simulation of Semiconductor Processes and Devices, SISPAD indexed in Scopus and Web of Science?

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD is indexed in Scopus.

What is the aims and scope of International Conference on Simulation of Semiconductor Processes and Devices, SISPAD?

Subject areas: Computer Science Applications; Electrical and Electronic Engineering; Modeling and Simulation.

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Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref