Home›Search›International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN1946-1577
✓ Scopus / SJR
20
/ 100
Limited verification
PubScope credibility score from verifiable indexing & ethics signals
Score Breakdown
◆ No selective/vetting index found20
Total20
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Scorei
0.211
H-Indexi
7

Aims & Scope

Subject areas: Computer Science Applications; Electrical and Electronic Engineering; Modeling and Simulation.

General Information

Country / RegionUnited States
Primary Language—
1st Year Published—
StatusActive
Total Publications—

Submission Info

Peer Review—
Review Time—
Acceptance Rate—
OA License—
OA Rate—

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

4/12 · 33%
✅
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
❌
Does the journal have a website?
No URL
✅
Is the ISSN verified?
1946-1577
✅
Indexed in a trusted database?
Scopus
❌
Peer review process documented?
N/A
❌
Follows ethical publishing standards (COPE)?
N/A
❌
APC fees clearly disclosed?
N/A
✅
Not on predatory/blacklists?
✓ Clean
❌
Long-term digital preservation?
N/A
❌
Plagiarism detection in place?
N/A
❌
Listed in DOAJ (verified OA)?
N/A
❌
Primary language documented?
N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Computer Science ApplicationsUnranked
Electrical and Electronic EngineeringUnranked
Modeling and SimulationUnranked

Subject Classification

Scopus Categories

Computer Science ApplicationsElectrical and Electronic EngineeringModeling and Simulation

Frequently asked questions about International Conference on Simulation of Semiconductor Processes and Devices, SISPAD

Is International Conference on Simulation of Semiconductor Processes and Devices, SISPAD a predatory journal?

PubScope has no integrity flags on record for International Conference on Simulation of Semiconductor Processes and Devices, SISPAD: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Its PubScope Trust Score is 20/100. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of International Conference on Simulation of Semiconductor Processes and Devices, SISPAD?

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.211.

Is International Conference on Simulation of Semiconductor Processes and Devices, SISPAD indexed in Scopus and Web of Science?

International Conference on Simulation of Semiconductor Processes and Devices, SISPAD is indexed in Scopus.

What is the aims and scope of International Conference on Simulation of Semiconductor Processes and Devices, SISPAD?

Subject areas: Computer Science Applications; Electrical and Electronic Engineering; Modeling and Simulation.

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Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref