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European Solid-State Device Research Conference

Editions Frontieres · France · Est. 2006

ISSN2378-6558

✓ Scopus / SJR

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.262

H-Indexi

Total Worksi

Total Citationsi

642

2yr Mean Citednessi

0.00

Open Impact Factor alternative

Aims & Scope

Subject areas: Electrical and Electronic Engineering; Safety, Risk, Reliability and Quality.

General Information

Country / RegionFrance

Primary Language—

1st Year Published2006

Annual Volume~ 1 articles / year

StatusActive (last: 2006)

Total Publications68

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Peer Review—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/11 · 36%

✅

Do you know the journal / publisher?

Editions Frontieres

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

2378-6558

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published

Citations received

2009

2010

2011

2012

2013

2015

2016

2017

Source: OpenAlex · Each year’s green bar = citations earned by that year’s papers, counted to date — so recent years look lower simply because their papers haven’t had time to be cited yet.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

Safety, Risk, Reliability and QualityUnranked

Subject Classification

Scopus Categories

Electrical and Electronic EngineeringSafety, Risk, Reliability and Quality

Research Topics (OpenAlex)

Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignFerroelectric and Negative Capacitance DevicesIntegrated Circuits and Semiconductor Failure AnalysisSilicon Carbide Semiconductor TechnologiesAdvanced Memory and Neural ComputingQuantum and electron transport phenomenaNanowire Synthesis and ApplicationsElectrostatic Discharge in ElectronicsRadio Frequency Integrated Circuit Design

Frequently asked questions about European Solid-State Device Research Conference

Is European Solid-State Device Research Conference a predatory journal?

PubScope has no integrity flags on record for European Solid-State Device Research Conference: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of European Solid-State Device Research Conference?

European Solid-State Device Research Conference is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.262.

Is European Solid-State Device Research Conference indexed in Scopus and Web of Science?

European Solid-State Device Research Conference is indexed in Scopus.

What is the aims and scope of European Solid-State Device Research Conference?