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Microelectronics Reliability

Elsevier Ltd · United Kingdom

ISSN0026-2714eISSN1872-941X

SJR Q2✓ WOS SCIE✓ Scopus / SJR

Impact Factor & Quartile · Web of Science (JCR)

✓ Indexed in the Web of Science Core Collection (SCIE) — Clarivate publishes an official Journal Impact Factor and JCR quartile for this journal.

See the official Impact Factor & quartile on the journal’s page ↗

The Impact Factor & JCR quartile are licensed by Clarivate — we link you to the official source instead of reprinting a number that can go out of date. Open metrics below: SCImago Q2. Source: Clarivate Journal Citation Reports.

📊 Standing in its field

Where this journal ranks among others in the same subject area.

SJR · Scopus

Top 50% in field

Clarivate’s JCR quartile is a separate ranking and may differ

SJR Scorei

0.464

H-Indexi

131

SNIPi

0.932

Total Worksi

30,954

Total Citationsi

199,665

2yr Mean Citednessi

1.88

Open Impact Factor alternative

Retractions

Source: Retraction Watch

Aims & Scope✦ Compiled from public sources

Microelectronics Reliability is dedicated to disseminating research on the reliability of microelectronic devices, circuits, and systems. Its coverage includes materials, process, manufacturing, design, testing, operation, measurement, understanding, analysis, evaluation, prediction, modeling, simulation, methodologies, and mitigation. The journal also covers topics such as optoelectronics, composite materials, reliability in semiconductors, electronic engineering, and voltage.

AI-compiled from public web sources · verify on publisher page →

General Information

Country / RegionUnited Kingdom

Primary LanguageEnglish

1st Year Published—

Annual Volume~ 279 articles / year

StatusActive

Total Publications30,954

Publisher OrgElsevier BV

Visit Journal Website

Submission Info

Publishing ModelHybrid

Peer Review—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

⚡ Hybrid journal — subscription model available.

Think.Check.Submit Compliance

thinkchecksubmit.org

6/11 · 55%

✅

Do you know the journal / publisher?

Elsevier Ltd

✅

Does the journal have a website?

✓ Linked

✅

Is the ISSN verified?

0026-2714 / 1872-941X

✅

Indexed in a trusted database?

WoS, Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

✅

Primary language documented?

English

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published

Citations received

336

3.6k

2019

367

3.9k

2020

361

4.1k

2021

347

2.9k

2022

327

2.4k

2023

189

2024

320

788

2025

233

2026

Source: OpenAlex · Each year’s green bar = citations earned by that year’s papers, counted to date — so recent years look lower simply because their papers haven’t had time to be cited yet.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Atomic and Molecular Physics, and OpticsQ2

Condensed Matter PhysicsQ2

Electrical and Electronic EngineeringQ2

Electronic, Optical and Magnetic MaterialsQ2

Safety, Risk, Reliability and QualityQ2

Surfaces, Coatings and FilmsQ2

Nanoscience and NanotechnologyQ3

Subject Classification

Web of Science Categories

Engineering, Electrical & ElectronicNanoscience & NanotechnologyPhysics, Applied

Scopus Categories

Condensed Matter PhysicsAtomic and Molecular Physics, and OpticsNanoscience and NanotechnologyElectrical and Electronic EngineeringElectronic, Optical and Magnetic MaterialsSurfaces, Coatings and FilmsSafety, Risk, Reliability and Quality

Research Topics (OpenAlex)

Semiconductor materials and devicesIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Semiconductor Devices and Circuit DesignElectronic Packaging and Soldering TechnologiesReliability and Maintenance Optimization

Frequently asked questions about Microelectronics Reliability

Is Microelectronics Reliability a predatory journal?

PubScope has no integrity flags on record for Microelectronics Reliability: it is indexed in Web of Science, Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of Microelectronics Reliability?

Microelectronics Reliability is indexed in the Web of Science Core Collection, so Clarivate publishes an official Journal Impact Factor for it (since the 2023 Journal Citation Reports, every Core Collection journal — including Arts & Humanities and Emerging Sources titles — receives one). PubScope links to Clarivate's official source rather than reprinting the number, which can be out of date. Its open 2-year mean citedness is 1.88.

Is Microelectronics Reliability indexed in Scopus and Web of Science?

Microelectronics Reliability is indexed in Web of Science, Scopus.