IEEE Transactions on Device and Materials Reliability
Institute of Electrical and Electronics Engineers Inc. · United States · Est. 2001
✓ Indexed in the Web of Science Core Collection (SCIE) — Clarivate publishes an official Journal Impact Factor and JCR quartile for this journal.
See the official Impact Factor & quartile on the journal’s page ↗The Impact Factor & JCR quartile are licensed by Clarivate — we link you to the official source instead of reprinting a number that can go out of date. Open metrics below: SCImago Q2 · Scopus CiteScore 4.6. Source: Clarivate Journal Citation Reports.
Aims & Scope
IEEE Transactions on Device and Materials Reliability publishes original research on the reliability of electronic materials, fabrication processes, devices (such as FETs and bipolar transistors), interconnects, ICs, integrated microsystems (including MEMS and sensors), thin-film technologies, memories, packaging and heterogeneous assemblies—spanning both established and emerging fields. The journal welcomes contributions that advance understanding of degradation, failure mechanisms, long-term performance, and fatigue behavior through experimental studies integrated with modeling and simulation.
General Information
Submission Info
Ethics & Quality
Think.Check.Submit Compliance
A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
Publication & Citation Trend
Source: OpenAlex · Each year’s green bar = citations earned by that year’s papers, counted to date — so recent years look lower simply because their papers haven’t had time to be cited yet.
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Subject Classification
Web of Science Categories
Scopus Categories
Research Topics (OpenAlex)
Frequently asked questions about IEEE Transactions on Device and Materials Reliability
Is IEEE Transactions on Device and Materials Reliability a predatory journal?
PubScope has no integrity flags on record for IEEE Transactions on Device and Materials Reliability: it is indexed in Web of Science, Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.
What is the impact factor of IEEE Transactions on Device and Materials Reliability?
IEEE Transactions on Device and Materials Reliability is indexed in the Web of Science Core Collection, so Clarivate publishes an official Journal Impact Factor for it (since the 2023 Journal Citation Reports, every Core Collection journal — including Arts & Humanities and Emerging Sources titles — receives one). PubScope links to Clarivate's official source rather than reprinting the number, which can be out of date. As an open alternative, its Scopus CiteScore is 4.6.
Is IEEE Transactions on Device and Materials Reliability indexed in Scopus and Web of Science?
IEEE Transactions on Device and Materials Reliability is indexed in Web of Science, Scopus.
What is the aims and scope of IEEE Transactions on Device and Materials Reliability?
IEEE Transactions on Device and Materials Reliability publishes original research on the reliability of electronic materials, fabrication processes, devices (such as FETs and bipolar transistors), interconnects, ICs, integrated microsystems (including MEMS and sensors), thin-film technologies, memories, packaging and heterogeneous assemblies—spanning both established and emerging fields. The journal welcomes contributions that advance understanding of degradation, failure mechanisms, long-term performance, and fatigue behavior through experimental studies integrated with modeling and simulatio
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See all →Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref