IEEE Transactions on Device and Materials Reliability publishes original research on the reliability of electronic materials, fabrication processes, devices (such as FETs and bipolar transistors), interconnects, ICs, integrated microsystems (including MEMS and sensors), thin-film technologies, memories, packaging and heterogeneous assemblies—spanning both established and emerging fields. The journal welcomes contributions that advance understanding of degradation, failure mechanisms, long-term performance, and fatigue behavior through experimental studies integrated with modeling and simulation.
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
Q2
SJR Rank
Top 50% in field
General Information
Country / RegionUnited States
Primary LanguageEnglish
1st Year Published2001
Frequency4
StatusActive (last: 2026)
Total Publications2,745
Publisher OrgInstitute of Electrical and Electronics Engineers
Electrical and Electronic EngineeringSafety, Risk, Reliability and QualityElectronic, Optical and Magnetic Materials
Research Topics (OpenAlex)
Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure AnalysisElectronic Packaging and Soldering TechnologiesFerroelectric and Negative Capacitance DevicesSilicon Carbide Semiconductor TechnologiesElectrostatic Discharge in ElectronicsRadiation Effects in ElectronicsVLSI and Analog Circuit Testing3D IC and TSV technologies