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IEEE Transactions on Device and Materials Reliability

Institute of Electrical and Electronics Engineers Inc. · United States · Est. 2001

ISSN1530-4388eISSN1558-2574
SJR Q2✓ WOS SCIE✓ Scopus / SJR
90
/ 100
High Trust
PubScope credibility score from verifiable indexing & ethics signals
Score Breakdown
◆ WoS flagship (SCIE/SSCI/AHCI)78
✓ Corroboration (2 more)+12
Total90
Level data: Norwegian Register (HK-dir), NLOD 2.0. · Third-party records · how this is calculated · Report an error →
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
Publication speed: not measurable
publisher doesn’t disclose per-article submission dates — we never estimate
Q2
SJR Rank
Top 50% in field
Impact Factor & Quartile · Web of Science (JCR)

✓ Indexed in the Web of Science Core Collection (SCIE) — Clarivate publishes an official Journal Impact Factor and JCR quartile for this journal.

See the official Impact Factor & quartile on the journal’s page ↗

The Impact Factor & JCR quartile are licensed by Clarivate — we link you to the official source instead of reprinting a number that can go out of date. Open metrics below: SCImago Q2 · Scopus CiteScore 4.9. Source: Clarivate Journal Citation Reports.

SJR Scorei
0.451
H-Indexi
88
CiteScorei
4.9
SNIPi
1.223
Total Worksi
2,745
Total Citationsi
46,902
2yr Mean Citednessi
1.42
Open Impact Factor alternative

Aims & Scope

IEEE Transactions on Device and Materials Reliability publishes original research on the reliability of electronic materials, fabrication processes, devices (such as FETs and bipolar transistors), interconnects, ICs, integrated microsystems (including MEMS and sensors), thin-film technologies, memories, packaging and heterogeneous assemblies—spanning both established and emerging fields. The journal welcomes contributions that advance understanding of degradation, failure mechanisms, long-term performance, and fatigue behavior through experimental studies integrated with modeling and simulation.

General Information

Country / RegionUnited States
Primary LanguageEnglish
1st Year Published2001
Frequency4
StatusActive (last: 2026)
Total Publications2,745
Publisher OrgInstitute of Electrical and Electronics Engineers
Visit Journal Website

Submission Info

APC Cost$2,800Above median
Peer Reviewsingle and/or double anonymous
Review Time—
Acceptance Rate—
OA License—
OA Rate—

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes
Plagiarism Detection✓ Yes

Think.Check.Submit Compliance

9/12 · 75%
✅
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
✅
Does the journal have a website?
✓ Linked
✅
Is the ISSN verified?
1530-4388 / 1558-2574
✅
Indexed in a trusted database?
WoS, Scopus
✅
Peer review process documented?
single and/or double anonymous
❌
Follows ethical publishing standards (COPE)?
N/A
✅
APC fees clearly disclosed?
$2,800
✅
Not on predatory/blacklists?
✓ Clean
❌
Long-term digital preservation?
N/A
✅
Plagiarism detection in place?
Yes
❌
Listed in DOAJ (verified OA)?
N/A
✅
Primary language documented?
English

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published
Citations received
126
1.6k
2019
122
1.3k
2020
120
1.1k
2021
96
722
2022
103
644
2023
109
383
2024
151
155
2025
84
6
2026

Source: OpenAlex · Each year’s green bar = citations earned by that year’s papers, counted to date — so recent years look lower simply because their papers haven’t had time to be cited yet.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringQ2
Safety, Risk, Reliability and QualityQ2
Electronic, Optical and Magnetic MaterialsQ3

Subject Classification

Web of Science Categories

Engineering, Electrical & ElectronicPhysics, Applied

Scopus Categories

Electrical and Electronic EngineeringSafety, Risk, Reliability and QualityElectronic, Optical and Magnetic Materials

Research Topics (OpenAlex)

Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure AnalysisElectronic Packaging and Soldering TechnologiesFerroelectric and Negative Capacitance DevicesSilicon Carbide Semiconductor TechnologiesElectrostatic Discharge in ElectronicsRadiation Effects in ElectronicsVLSI and Analog Circuit Testing3D IC and TSV technologies

Frequently asked questions about IEEE Transactions on Device and Materials Reliability

Is IEEE Transactions on Device and Materials Reliability a predatory journal?

PubScope has no integrity flags on record for IEEE Transactions on Device and Materials Reliability: it is indexed in Web of Science, Scopus, and is not on DOAJ's withdrawn list. Its PubScope Trust Score is 90/100. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of IEEE Transactions on Device and Materials Reliability?

IEEE Transactions on Device and Materials Reliability is indexed in the Web of Science Core Collection, so Clarivate publishes an official Journal Impact Factor for it (since the 2023 Journal Citation Reports, every Core Collection journal — including Arts & Humanities and Emerging Sources titles — receives one). PubScope links to Clarivate's official source rather than reprinting the number, which can be out of date. As an open alternative, its Scopus CiteScore is 4.9.

Is IEEE Transactions on Device and Materials Reliability indexed in Scopus and Web of Science?

IEEE Transactions on Device and Materials Reliability is indexed in Web of Science, Scopus.

What is the aims and scope of IEEE Transactions on Device and Materials Reliability?

IEEE Transactions on Device and Materials Reliability publishes original research on the reliability of electronic materials, fabrication processes, devices (such as FETs and bipolar transistors), interconnects, ICs, integrated microsystems (including MEMS and sensors), thin-film technologies, memories, packaging and heterogeneous assemblies—spanning both established and emerging fields. The journal welcomes contributions that advance understanding of degradation, failure mechanisms, long-term performance, and fatigue behavior through experimental studies integrated with modeling and simulatio

How much does it cost to publish in IEEE Transactions on Device and Materials Reliability?

IEEE Transactions on Device and Materials Reliability charges an article processing charge (APC) of about $2,800 for open-access publication.

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Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref