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Ultramicroscopy

Elsevier B.V. · Netherlands

ISSN0304-3991eISSN1879-2723

SJR Q2✓ WOS SCIE✓ Scopus / SJR

/ 100

Medium Risk

Score Breakdown

✓ WoS SCIE/SSCI+25

✓ Scopus Q2+18

Total43

Journal Impact Factor

This journal is indexed in Web of Science (JCR) and has an official Journal Impact Factor. View the current value on the journal’s page ↗

SJR Score

0.716

H-Index

178

CiteScore

View ↗

Scopus metric · on the journal’s page

SNIP

1.151

Total Works

9,754

Total Citations

241,803

2yr Mean Citedness

2.21

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Retractions

Source: Retraction Watch

Aims & Scope✦ Inferred from recent articles

This journal focuses on the application and advancement of electron microscopy techniques for materials characterization. Articles investigate the influence of experimental parameters such as accelerating voltage and electron scattering on spatial resolution and phase indexing in techniques like SEM-EBSD and TEM. The scope also includes the development of new reconstruction methods, like ptychography, and detector technologies for improved quantitative analysis and signal detection in electron microscopy.

AI-summarised from recent articles · verify on publisher page →

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

SJR Rank

Top 50% in field

General Information

Country / RegionNetherlands

Primary LanguageEnglish

1st Year Published—

Annual Volume~ 128 articles / year

StatusActive

Total Publications9,754

Publisher OrgElsevier BV

Visit Journal Website

Submission Info

Publishing ModelHybrid

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

⚡ Hybrid journal — subscription model available.

Think.Check.Submit Compliance

thinkchecksubmit.org

6/12 · 50%

✅

Do you know the journal / publisher?

Elsevier B.V.

✅

Does the journal have a website?

✓ Linked

✅

Is the ISSN verified?

0304-3991 / 1879-2723

✅

Indexed in a trusted database?

WoS, Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

✅

Primary language documented?

English

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published

Times cited

2019

2020

2021

2022

2023

2024

2025

2026

Source: OpenAlex · Note: citations accumulate over time so older years appear higher

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Atomic and Molecular Physics, and OpticsQ2

Electronic, Optical and Magnetic MaterialsQ2

InstrumentationQ2

Subject Classification

Web of Science Categories

Microscopy

Scopus Categories

Atomic and Molecular Physics, and OpticsInstrumentationElectronic, Optical and Magnetic Materials

Research Topics (OpenAlex)

Electron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsForce Microscopy Techniques and ApplicationsIntegrated Circuits and Semiconductor Failure AnalysisAdvanced X-ray Imaging Techniques