This journal focuses on the application and development of microscopy techniques, particularly electron microscopy (TEM, STEM, SEM) and related spectroscopies (EELS, SXES). It covers advancements in sample preparation, imaging methodologies for beam-sensitive and nanoscale materials, in-situ and operando analysis, and quantitative interpretation of microscopy data. The journal also explores computational methods for aberration control and image simulation, as well as applications in materials science, condensed matter physics, and biological imaging.
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
Publication & Citation Trend
Articles published
Times cited
2019
2020
2021
2022
2023
2024
2025
2026
Source: OpenAlex · Note: citations accumulate over time so older years appear higher
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
InstrumentationQ2
Radiology, Nuclear Medicine and ImagingQ2
Structural BiologyQ3
Subject Classification
Web of Science Categories
Microscopy
Scopus Categories
Radiology, Nuclear Medicine and ImagingStructural BiologyInstrumentation
Research Topics (OpenAlex)
Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesForce Microscopy Techniques and ApplicationsAdvanced Fluorescence Microscopy TechniquesAdvanced X-ray Imaging TechniquesIntegrated Circuits and Semiconductor Failure AnalysisDiverse Scientific and Economic StudiesEarthquake and Disaster Impact StudiesNanofabrication and Lithography TechniquesIon-surface interactions and analysis