Home›Search›Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN1065-2221

✓ Scopus / SJR

/ 100

Established

PubScope credibility score from verifiable indexing & ethics signals

Score Breakdown

◆ Norwegian Register Level 152

Total52

Level data: Norwegian Register (HK-dir), NLOD 2.0. · Third-party records · how this is calculated · Report an error →

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.208

H-Indexi

Total Worksi

Total Citationsi

727

2yr Mean Citednessi

0.00

Open Impact Factor alternative

Aims & Scope

Subject areas: Electrical and Electronic Engineering; Instrumentation.

General Information

Country / RegionUnited States

Primary Language—

1st Year Published—

Annual Volume~ 30 articles / year

StatusActive

Total Publications59

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Publishing ModelSubscription

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

1065-2221

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

InstrumentationUnranked

Subject Classification

Scopus Categories

Electrical and Electronic EngineeringInstrumentation

Research Topics (OpenAlex)

Heat Transfer and OptimizationHeat Transfer and Boiling StudiesHeat Transfer MechanismsThermal properties of materials3D IC and TSV technologiesSilicon Carbide Semiconductor TechnologiesElectronic Packaging and Soldering TechnologiesLow-power high-performance VLSI designFluid Dynamics and Turbulent FlowsSemiconductor materials and devices

Frequently asked questions about Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Is Annual IEEE Semiconductor Thermal Measurement and Management Symposium a predatory journal?

PubScope has no integrity flags on record for Annual IEEE Semiconductor Thermal Measurement and Management Symposium: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Its PubScope Trust Score is 52/100. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of Annual IEEE Semiconductor Thermal Measurement and Management Symposium?

Annual IEEE Semiconductor Thermal Measurement and Management Symposium is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.208.

Is Annual IEEE Semiconductor Thermal Measurement and Management Symposium indexed in Scopus and Web of Science?

Annual IEEE Semiconductor Thermal Measurement and Management Symposium is indexed in Scopus.

What is the aims and scope of Annual IEEE Semiconductor Thermal Measurement and Management Symposium?