Home›Search›IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
Institute of Electrical and Electronics Engineers Inc. · United States
ISSN1078-8743
SJR -✓ Scopus / SJR
0
/ 100
High Risk
Score Breakdown
No verified metrics
Total0
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Score
0.223
H-Index
8
SNIP
0.504
Total Works
71
Total Citations
210
2yr Mean Citedness
0.00
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Aims & Scope✦ Inferred from recent articles
This journal focuses on semiconductor manufacturing processes, including defectivity monitoring, yield analysis, and process control. It covers methodologies for in-line measurements, defect classification, and the optimization of manufacturing steps like lithography, etching, and chemical mechanical polishing. The scope also extends to design for manufacturability, metrology, and factory automation to improve efficiency and reduce costs.
AI-summarised from recent articles · verify on the publisher page
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
-
SJR Rank
Bottom 25%
General Information
Country / RegionUnited States
Primary Language—
1st Year Published—
Annual Volume~ 71 articles / year
StatusActive
Total Publications71
Publisher OrgInstitute of Electrical and Electronics Engineers
Institute of Electrical and Electronics Engineers Inc.
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Does the journal have a website?
No URL
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Is the ISSN verified?
1078-8743
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Indexed in a trusted database?
Scopus
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Peer review process documented?
N/A
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Follows ethical publishing standards (COPE)?
N/A
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APC fees clearly disclosed?
N/A
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Not on predatory/blacklists?
✓ Clean
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Long-term digital preservation?
N/A
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Plagiarism detection in place?
N/A
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Listed in DOAJ (verified OA)?
N/A
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Primary language documented?
N/A
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Electrical and Electronic EngineeringUnranked
Electronic, Optical and Magnetic MaterialsUnranked
Engineering (miscellaneous)Unranked
Industrial and Manufacturing EngineeringUnranked
Subject Classification
Scopus Categories
Industrial and Manufacturing EngineeringEngineering (miscellaneous)Electrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
Research Topics (OpenAlex)
Advancements in Photolithography TechniquesIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisAdvanced Surface Polishing TechniquesManufacturing Process and OptimizationSemiconductor materials and devicesVLSI and Analog Circuit TestingElectron and X-Ray Spectroscopy TechniquesScheduling and Optimization Algorithms3D IC and TSV technologies