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IEEE International Test Conference (TC)

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN1089-3539

✓ Scopus / SJR

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.58

H-Indexi

SNIPi

1.074

Total Worksi

122

Total Citationsi

2,067

2yr Mean Citednessi

0.00

Open Impact Factor alternative

Aims & Scope

Subject areas: Applied Mathematics; Electrical and Electronic Engineering.

General Information

Country / RegionUnited States

Primary Language—

1st Year Published—

Annual Volume~ 122 articles / year

StatusActive

Total Publications122

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Publishing ModelSubscription

Peer Review—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/11 · 36%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

1089-3539

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Applied MathematicsUnranked

Electrical and Electronic EngineeringUnranked

Subject Classification

Scopus Categories

Applied MathematicsElectrical and Electronic Engineering

Research Topics (OpenAlex)

VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test SystemsRadiation Effects in ElectronicsAdvancements in PLL and VCO TechnologiesLow-power high-performance VLSI designVLSI and FPGA Design TechniquesAdvancements in Photolithography TechniquesAnalog and Mixed-Signal Circuit DesignSemiconductor materials and devices

Frequently asked questions about IEEE International Test Conference (TC)

Is IEEE International Test Conference (TC) a predatory journal?

PubScope has no integrity flags on record for IEEE International Test Conference (TC): it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of IEEE International Test Conference (TC)?

IEEE International Test Conference (TC) is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.58.

Is IEEE International Test Conference (TC) indexed in Scopus and Web of Science?

IEEE International Test Conference (TC) is indexed in Scopus.

What is the aims and scope of IEEE International Test Conference (TC)?