Home›Search›IEEE International Test Conference (TC)
IEEE International Test Conference (TC)
Institute of Electrical and Electronics Engineers Inc. · United States
ISSN1089-3539
SJR -✓ Scopus / SJR
0
/ 100
High Risk
Score Breakdown
No verified metrics
Total0
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Score
0.452
H-Index
29
SNIP
1.074
Total Works
122
Total Citations
2,067
2yr Mean Citedness
0.00
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Aims & Scope✦ Inferred from recent articles
This journal focuses on the testing of electronic systems and integrated circuits. It covers topics such as built-in self-test (BIST), automatic test pattern generation (ATPG), boundary-scan testing, and JTAG interfaces. The scope also includes test compression techniques, fault modeling for complex defects, and testing of high-speed interfaces and embedded memories. Additionally, it addresses test power reduction, wafer-level packaging testing, and debug features for complex processors.
AI-summarised from recent articles · verify on the publisher page
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
-
SJR Rank
Bottom 25%
General Information
Country / RegionUnited States
Primary Language—
1st Year Published—
Annual Volume~ 122 articles / year
StatusActive
Total Publications122
Publisher OrgInstitute of Electrical and Electronics Engineers
Institute of Electrical and Electronics Engineers Inc.
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Does the journal have a website?
No URL
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Is the ISSN verified?
1089-3539
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Indexed in a trusted database?
Scopus
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Peer review process documented?
N/A
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Follows ethical publishing standards (COPE)?
N/A
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APC fees clearly disclosed?
N/A
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Not on predatory/blacklists?
✓ Clean
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Long-term digital preservation?
N/A
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Plagiarism detection in place?
N/A
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Listed in DOAJ (verified OA)?
N/A
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Primary language documented?
N/A
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Applied MathematicsUnranked
Electrical and Electronic EngineeringUnranked
Subject Classification
Scopus Categories
Applied MathematicsElectrical and Electronic Engineering
Research Topics (OpenAlex)
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisEngineering and Test SystemsRadiation Effects in ElectronicsAdvancements in PLL and VCO TechnologiesLow-power high-performance VLSI designVLSI and FPGA Design TechniquesAdvancements in Photolithography TechniquesAnalog and Mixed-Signal Circuit DesignSemiconductor materials and devices