Home›Search›Proceedings of the European Test Workshop
Proceedings of the European Test Workshop
Institute of Electrical and Electronics Engineers Inc. · United States · Est. 2007
ISSN1530-1877
SJR -✓ Scopus / SJR
0
/ 100
High Risk
Score Breakdown
No verified metrics
Total0
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Score
0.293
H-Index
13
SNIP
0.545
Total Works
25
Total Citations
594
2yr Mean Citedness
0.00
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Aims & Scope✦ Inferred from recent articles
The Proceedings of the European Test Workshop focuses on methodologies and tools for testing integrated circuits and systems. This includes developing algorithms for diagnosis and fault analysis, designing test patterns for various fault models, and optimizing test application time and power consumption. The scope also covers built-in self-test (BIST) techniques, system-level testing for complex packages like System-in-Package (SiP), and testing for emerging technologies such as nanometric circuits, memory technologies, and microfluidic biochips. Emphasis is placed on improving test efficiency, reducing costs, and enhancing product reliability and yield through advanced test and diagnosis strategies.
AI-summarised from recent articles · verify on the publisher page
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
-
SJR Rank
Bottom 25%
General Information
Country / RegionUnited States
Primary Language—
1st Year Published2007
Annual Volume~ 25 articles / year
StatusActive (last: 2007)
Total Publications25
Publisher OrgInstitute of Electrical and Electronics Engineers
Institute of Electrical and Electronics Engineers Inc.
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Does the journal have a website?
No URL
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Is the ISSN verified?
1530-1877
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Indexed in a trusted database?
Scopus
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Peer review process documented?
N/A
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Follows ethical publishing standards (COPE)?
N/A
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APC fees clearly disclosed?
N/A
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Not on predatory/blacklists?
✓ Clean
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Long-term digital preservation?
N/A
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Plagiarism detection in place?
N/A
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Listed in DOAJ (verified OA)?
N/A
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Primary language documented?
N/A
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Electrical and Electronic EngineeringUnranked
Industrial and Manufacturing EngineeringUnranked
SoftwareUnranked
Subject Classification
Scopus Categories
Industrial and Manufacturing EngineeringSoftwareElectrical and Electronic Engineering
Research Topics (OpenAlex)
VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in ElectronicsEmbedded Systems Design TechniquesAdvancements in Photolithography TechniquesAdvancements in PLL and VCO TechnologiesRadio Frequency Integrated Circuit DesignLow-power high-performance VLSI designInterconnection Networks and Systems3D IC and TSV technologies