Home›Search›JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3

JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3

SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS · US · Est. 2002

ISSN1932-5150eISSN2708-8340

SJR Q2✓ WOS SCIE✓ Scopus / SJR

/ 100

High Trust

PubScope credibility score from verifiable indexing & ethics signals

Score Breakdown

◆ WoS flagship (SCIE/SSCI/AHCI)78

✓ Corroboration (2 more)+12

Total90

Level data: Norwegian Register (HK-dir), NLOD 2.0. · Third-party records · how this is calculated · Report an error →

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

Publication speed: not measurable

publisher doesn’t disclose per-article submission dates — we never estimate

SJR Rank

Top 50% in field

Impact Factor & Quartile · Web of Science (JCR)

✓ Indexed in the Web of Science Core Collection (SCIE) — Clarivate publishes an official Journal Impact Factor and JCR quartile for this journal.

Find the journal’s official page ↗Open the official JCR record on Clarivate ↗

The Impact Factor & JCR quartile are licensed by Clarivate — we link you to the official source instead of reprinting a number that can go out of date. Open metrics below: SCImago Q2. Source: Clarivate Journal Citation Reports.

SJR Scorei

0.437

H-Indexi

Total Worksi

1,675

Total Citationsi

17,486

2yr Mean Citednessi

0.00

Open Impact Factor alternative

Aims & Scope

Subject areas: Engineering, Electrical & Electronic; Materials Science, Multidisciplinary; Nanoscience & Nanotechnology; Optics; Atomic and Molecular Physics, and Optics; Condensed Matter Physics; Electrical and Electronic Engineering; Mechanical Engineering; Electronic, Optical and Magnetic Materials.

General Information

Country / RegionUS

Primary LanguageEnglish

1st Year Published2002

Annual Volume~ 59 articles / year

Status⚠️ Inactive

Total Publications1,675

Publisher OrgSPIE

Submission Info

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

5/12 · 42%

✅

Do you know the journal / publisher?

SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

1932-5150 / 2708-8340

✅

Indexed in a trusted database?

WoS, Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

✅

Primary language documented?

English

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published

Citations received

128

1.3k

2013

130

1.3k

2014

124

1.2k

2015

130

1.2k

2016

963

2017

907

2018

535

2019

316

2020

Source: OpenAlex · Each year’s green bar = citations earned by that year’s papers, counted to date — so recent years look lower simply because their papers haven’t had time to be cited yet.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Atomic and Molecular Physics, and OpticsQ2

Condensed Matter PhysicsQ2

Electrical and Electronic EngineeringQ2

Mechanical EngineeringQ2

Electronic, Optical and Magnetic MaterialsQ3

Subject Classification

Web of Science Categories

Engineering, Electrical & ElectronicMaterials Science, MultidisciplinaryNanoscience & NanotechnologyOptics

Research Topics (OpenAlex)

Advancements in Photolithography TechniquesNanofabrication and Lithography TechniquesIntegrated Circuits and Semiconductor Failure AnalysisOptical Coatings and GratingsElectron and X-Ray Spectroscopy TechniquesAdvanced MEMS and NEMS TechnologiesAdvanced Surface Polishing TechniquesPhotonic and Optical DevicesMechanical and Optical ResonatorsForce Microscopy Techniques and Applications

Frequently asked questions about JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3

Is JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 a predatory journal?

PubScope has no integrity flags on record for JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3: it is indexed in Web of Science, Scopus, and is not on DOAJ's withdrawn list. Its PubScope Trust Score is 90/100. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3?

JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 is indexed in the Web of Science Core Collection, so Clarivate publishes an official Journal Impact Factor for it (since the 2023 Journal Citation Reports, every Core Collection journal — including Arts & Humanities and Emerging Sources titles — receives one). PubScope links to Clarivate's official source rather than reprinting the number, which can be out of date.

Is JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 indexed in Scopus and Web of Science?

JOURNAL OF MICRO-NANOPATTERNING MATERIALS AND METROLOGY-JM3 is indexed in Web of Science, Scopus.