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Journal of Microelectronic Manufacturing

JommPublish · United States

eISSN2578-3769

✓ DOAJ✓ Open Access

/ 100

High Risk

Score Breakdown

✓ DOAJ Verified+15

Total15

Aims & Scope

JoMM is devoted to publishing research on the cutting-edge microelectronic manufacturing technology. The scope of the journal covers studies of advanced semiconductor manufacturing sciences and technologies from fundamental research to industrial high volume manufacturing applications. The perspective scope includes, but is not limited to the following areas: -Design -Circuit and Device -Modeling and Simulation -Process -Metrology, Testing and Yield control -Packaging -Materials -Equipment

General Information

Country / RegionUnited States

Primary LanguageEnglish

1st Year Published—

FrequencyQuarterly

StatusActive

Total Publications—

Visit Journal Website

Submission Info

Peer ReviewAnonymous peer review

Review Time—

Acceptance Rate—

OA LicenseCC BY

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

📦 Long-term Preservation

PORTICO

Think.Check.Submit Compliance

thinkchecksubmit.org

10/12 · 83%

✅

Do you know the journal / publisher?

JommPublish

✅

Does the journal have a website?

✓ Linked

✅

Is the ISSN verified?

2578-3769

✅

Indexed in a trusted database?

DOAJ

✅

Peer review process documented?

Anonymous peer review

❌

Follows ethical publishing standards (COPE)?

N/A

✅

APC fees clearly disclosed?

Yes

✅

Not on predatory/blacklists?

✓ Clean

✅

Long-term digital preservation?

PORTICO

❌

Plagiarism detection in place?

N/A

✅

Listed in DOAJ (verified OA)?

DOAJ verified

✅

Primary language documented?

English

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Subject Classification

Research Topics (OpenAlex)

Advancements in Photolithography TechniquesSemiconductor materials and devicesManufacturing Process and OptimizationAdvancements in Semiconductor Devices and Circuit DesignIndustrial Vision Systems and Defect Detection3D IC and TSV technologiesElectronic Packaging and Soldering TechnologiesVLSI and Analog Circuit TestingAdvanced Surface Polishing TechniquesElectron and X-Ray Spectroscopy Techniques