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Experience of Designing and Application of CAD Systems in Microelectronics
Institute of Electrical and Electronics Engineers Inc. · United States
ISSN2572-7591
SJR Q4✓ Scopus / SJR
5
/ 100
High Risk
Score Breakdown
✓ Scopus Q4+5
Total5
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Score
0.151
H-Index
13
Aims & Scope✦ Compiled from public sources
Experience of Designing and Application of CAD Systems in Microelectronics publishes research related to Computer Science, Engineering, and Mathematics. The journal covers topics such as technological design problems, models and methods for radioelectronics device and system design, design of specialized systems and devices, technical design, and electromagnetic and thermal problems in microelectronics.
AI-compiled from public web sources · verify on the publisher page
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
Institute of Electrical and Electronics Engineers Inc.
❌
Does the journal have a website?
No URL
✅
Is the ISSN verified?
2572-7591
✅
Indexed in a trusted database?
Scopus
❌
Peer review process documented?
N/A
❌
Follows ethical publishing standards (COPE)?
N/A
❌
APC fees clearly disclosed?
N/A
✅
Not on predatory/blacklists?
✓ Clean
❌
Long-term digital preservation?
N/A
❌
Plagiarism detection in place?
N/A
❌
Listed in DOAJ (verified OA)?
N/A
❌
Primary language documented?
N/A
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Computer Graphics and Computer-Aided DesignQ4
Computer Science ApplicationsQ4
Electrical and Electronic EngineeringQ4
Modeling and SimulationQ4
Safety, Risk, Reliability and QualityQ4
SoftwareQ4
Subject Classification
Scopus Categories
Computer Science ApplicationsComputer Graphics and Computer-Aided DesignSoftwareElectrical and Electronic EngineeringSafety, Risk, Reliability and QualityModeling and Simulation