Homeβ€ΊSearchβ€ΊExperience of Designing and Application of CAD Systems in Microelectronics

Experience of Designing and Application of CAD Systems in Microelectronics

Institute of Electrical and Electronics Engineers Inc. Β· United States

ISSN2572-7591
SJR Q4βœ“ Scopus / SJR
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
πŸ“Š Standing in its field
Where this journal ranks among others in the same subject area.
Q4
SJR Β· Scopus
Bottom 25%
Clarivate’s JCR quartile is a separate ranking and may differ
SJR Scorei
0.151
H-Indexi
13

Aims & Scope✦ Compiled from public sources

Experience of Designing and Application of CAD Systems in Microelectronics publishes research related to Computer Science, Engineering, and Mathematics. The journal covers topics such as technological design problems, models and methods for radioelectronics device and system design, design of specialized systems and devices, technical design, and electromagnetic and thermal problems in microelectronics.

AI-compiled from public web sources Β· verify on the publisher page

General Information

Country / RegionUnited States
Primary Languageβ€”
1st Year Publishedβ€”
StatusActive
Total Publicationsβ€”

Submission Info

Peer Reviewβ€”
OA Licenseβ€”
OA Rateβ€”

Ethics & Quality

COPE Memberβœ— No
OASPA Memberβœ— No
Not on Predatory Listsβœ“ Yes

Think.Check.Submit Compliance

4/11 Β· 36%
βœ…
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
❌
Does the journal have a website?
No URL
βœ…
Is the ISSN verified?
2572-7591
βœ…
Indexed in a trusted database?
Scopus
❌
Peer review process documented?
N/A
❌
Follows ethical publishing standards (COPE)?
N/A
βœ…
Not on predatory/blacklists?
βœ“ Clean
❌
Long-term digital preservation?
N/A
❌
Plagiarism detection in place?
N/A
❌
Listed in DOAJ (verified OA)?
N/A
❌
Primary language documented?
N/A

A twelfth criterion β€” whether APC fees are clearly disclosed β€” is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category β€” its quartile can differ by discipline.

Computer Graphics and Computer-Aided DesignQ4
Computer Science ApplicationsQ4
Electrical and Electronic EngineeringQ4
Modeling and SimulationQ4
Safety, Risk, Reliability and QualityQ4
SoftwareQ4

Subject Classification

Scopus Categories

Computer Science ApplicationsComputer Graphics and Computer-Aided DesignSoftwareElectrical and Electronic EngineeringSafety, Risk, Reliability and QualityModeling and Simulation

Frequently asked questions about Experience of Designing and Application of CAD Systems in Microelectronics

Is Experience of Designing and Application of CAD Systems in Microelectronics a predatory journal?

PubScope has no integrity flags on record for Experience of Designing and Application of CAD Systems in Microelectronics: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee β€” always confirm fit and policies before submitting.

What is the impact factor of Experience of Designing and Application of CAD Systems in Microelectronics?

Experience of Designing and Application of CAD Systems in Microelectronics is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.151.

Is Experience of Designing and Application of CAD Systems in Microelectronics indexed in Scopus and Web of Science?

Experience of Designing and Application of CAD Systems in Microelectronics is indexed in Scopus.

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How to tell if a journal is predatoryWhat Q1–Q4 quartiles meanWeb of Science vs Scopus vs DOAJWhat is an APC?

Data updated: 2026-05-22 Β· Sources: SJR, DOAJ, OpenAlex, WoS, Crossref