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IEEE International Conference on Microelectronic Test Structures

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN1071-9032

✓ Scopus / SJR

/ 100

Established

PubScope credibility score from verifiable indexing & ethics signals

Score Breakdown

◆ Norwegian Register Level 152

Total52

Level data: Norwegian Register (HK-dir), NLOD 2.0. · Third-party records · how this is calculated · Report an error →

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.227

H-Indexi

Aims & Scope

Subject areas: Electrical and Electronic Engineering.

General Information

Country / RegionUnited States

Primary Language—

1st Year Published—

StatusActive

Total Publications—

Submission Info

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

1071-9032

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

Subject Classification

Scopus Categories

Electrical and Electronic Engineering

Frequently asked questions about IEEE International Conference on Microelectronic Test Structures

Is IEEE International Conference on Microelectronic Test Structures a predatory journal?

PubScope has no integrity flags on record for IEEE International Conference on Microelectronic Test Structures: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Its PubScope Trust Score is 52/100. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of IEEE International Conference on Microelectronic Test Structures?

IEEE International Conference on Microelectronic Test Structures is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.227.

Is IEEE International Conference on Microelectronic Test Structures indexed in Scopus and Web of Science?

IEEE International Conference on Microelectronic Test Structures is indexed in Scopus.

What is the aims and scope of IEEE International Conference on Microelectronic Test Structures?