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Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN2576-1501

✓ Scopus / SJR

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.347

H-Indexi

SNIPi

0.65

Aims & Scope✦ Compiled from public sources

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) provides a forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems. This includes emerging technologies, RISC-V architectures, and AI-based solutions.

AI-compiled from public web sources · verify on the publisher page

General Information

Country / RegionUnited States

Primary Language—

1st Year Published—

StatusActive

Total Publications—

Submission Info

Peer Review—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/11 · 36%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

2576-1501

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

Hardware and ArchitectureUnranked

Safety, Risk, Reliability and QualityUnranked

Signal ProcessingUnranked

Subject Classification

Scopus Categories

Hardware and ArchitectureElectrical and Electronic EngineeringSafety, Risk, Reliability and QualitySignal Processing

Frequently asked questions about Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT

Is Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT a predatory journal?

PubScope has no integrity flags on record for Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT?

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.347.

Is Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT indexed in Scopus and Web of Science?

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT is indexed in Scopus.