Home›Search›Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN2576-1501

SJR -✓ Scopus / SJR

/ 100

High Risk

Score Breakdown

No verified metrics

Total0

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Score

0.35

H-Index

SNIP

0.65

Aims & Scope✦ Compiled from public sources

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) provides a forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems. This includes emerging technologies, RISC-V architectures, and AI-based solutions.

AI-compiled from public web sources · verify on the publisher page

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

SJR Rank

Bottom 25%

General Information

Country / RegionUnited States

Primary Language—

1st Year Published—

StatusActive

Total Publications—

Submission Info

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

2576-1501

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

Hardware and ArchitectureUnranked

Safety, Risk, Reliability and QualityUnranked

Signal ProcessingUnranked

Subject Classification

Scopus Categories

Hardware and ArchitectureElectrical and Electronic EngineeringSafety, Risk, Reliability and QualitySignal Processing