Home›Search›IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings

IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings

Institute of Electrical and Electronics Engineers Inc. · United States

ISSN2642-7036
✓ Scopus / SJR
Journal Impact Factor
Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Scorei
0.134
H-Indexi
3

Aims & Scope

Subject areas: Artificial Intelligence; Control and Optimization; Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials; Instrumentation; Safety, Risk, Reliability and Quality.

General Information

Country / RegionUnited States
Primary Language—
1st Year Published—
StatusActive
Total Publications—

Submission Info

Peer Review—
OA License—
OA Rate—

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

4/11 · 36%
✅
Do you know the journal / publisher?
Institute of Electrical and Electronics Engineers Inc.
❌
Does the journal have a website?
No URL
✅
Is the ISSN verified?
2642-7036
✅
Indexed in a trusted database?
Scopus
❌
Peer review process documented?
N/A
❌
Follows ethical publishing standards (COPE)?
N/A
✅
Not on predatory/blacklists?
✓ Clean
❌
Long-term digital preservation?
N/A
❌
Plagiarism detection in place?
N/A
❌
Listed in DOAJ (verified OA)?
N/A
❌
Primary language documented?
N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Artificial IntelligenceUnranked
Control and OptimizationUnranked
Electrical and Electronic EngineeringUnranked
Electronic, Optical and Magnetic MaterialsUnranked
InstrumentationUnranked
Safety, Risk, Reliability and QualityUnranked

Subject Classification

Scopus Categories

Electrical and Electronic EngineeringControl and OptimizationArtificial IntelligenceInstrumentationSafety, Risk, Reliability and QualityElectronic, Optical and Magnetic Materials

Frequently asked questions about IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings

Is IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings a predatory journal?

PubScope has no integrity flags on record for IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings?

IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.134.

Is IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings indexed in Scopus and Web of Science?

IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings is indexed in Scopus.

What is the aims and scope of IEEE International Symposium for Design and Technology of Electronics Packages, SIITME - Conference Proceedings?

Subject areas: Artificial Intelligence; Control and Optimization; Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials; Instrumentation; Safety, Risk, Reliability and Quality.

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Data updated: 2026-05-22 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref