HomeSearchComputational Materials Today

Computational Materials Today

Elsevier · United Kingdom

eISSN2950-4635
DOAJOpen Access
15
/ 100
High Risk
Score Breakdown
DOAJ Verified+15
Total15

Aims & Scope✦ Inferred from recent articles

Computational Materials Today focuses on the application of computational methods, particularly machine learning and first-principles calculations, to predict and design materials with desired properties. The journal covers a wide range of materials, including semiconductors, polymers, glasses, electrolytes, and alloys, investigating their electronic, optical, mechanical, and thermal characteristics. Research also includes the development of novel computational algorithms and frameworks for materials discovery and analysis.

AI-summarised from recent articles · verify on publisher page →

General Information

Country / RegionUnited Kingdom
Primary LanguageEnglish
1st Year Published
StatusActive
Total Publications
Visit Journal Website

Submission Info

APC Cost$3,000Above median
Peer ReviewAnonymous peer review
Review Time
Acceptance Rate
OA LicenseCC BY, CC BY-NC, CC BY-NC-ND
OA Rate

Ethics & Quality

COPE Member✗ No
OASPA Member✗ No
Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

9/12 · 75%
Do you know the journal / publisher?
Elsevier
Does the journal have a website?
✓ Linked
Is the ISSN verified?
2950-4635
Indexed in a trusted database?
DOAJ
Peer review process documented?
Anonymous peer review
Follows ethical publishing standards (COPE)?
N/A
APC fees clearly disclosed?
$3,000
Not on predatory/blacklists?
✓ Clean
Long-term digital preservation?
N/A
Plagiarism detection in place?
N/A
Listed in DOAJ (verified OA)?
DOAJ verified
Primary language documented?
English

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Subject Classification

Research Topics (OpenAlex)

Machine Learning in Materials Science2D Materials and ApplicationsGraphene research and applicationsHydrogen Storage and MaterialsSemiconductor materials and devicesNanowire Synthesis and ApplicationsThermal properties of materialsElectronic and Structural Properties of OxidesX-ray Diffraction in CrystallographyTopological Materials and Phenomena
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Data updated: 2026-05-26 · Sources: SJR, DOAJ, OpenAlex, WoS, Crossref