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IEEE International Integrated Reliability Workshop Final Report

Institute of Electrical and Electronics Engineers Inc. · United States · Est. 2006

ISSN2374-8036

✓ Scopus / SJR

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.18

H-Indexi

Total Worksi

Total Citationsi

203

2yr Mean Citednessi

0.00

Open Impact Factor alternative

Aims & Scope

Subject areas: Electrical and Electronic Engineering; Electronic, Optical and Magnetic Materials; Safety, Risk, Reliability and Quality.

General Information

Country / RegionUnited States

Primary Language—

1st Year Published2006

Annual Volume~ 44 articles / year

StatusActive (last: 2006)

Total Publications44

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Peer Review—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/11 · 36%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

2374-8036

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

Electronic, Optical and Magnetic MaterialsUnranked

Safety, Risk, Reliability and QualityUnranked

Subject Classification

Scopus Categories

Electrical and Electronic EngineeringSafety, Risk, Reliability and QualityElectronic, Optical and Magnetic Materials

Research Topics (OpenAlex)

Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure AnalysisCopper Interconnects and ReliabilityFerroelectric and Negative Capacitance DevicesSilicon Carbide Semiconductor TechnologiesAdvanced Memory and Neural ComputingThin-Film Transistor TechnologiesSemiconductor materials and interfacesElectrostatic Discharge in Electronics

Frequently asked questions about IEEE International Integrated Reliability Workshop Final Report

Is IEEE International Integrated Reliability Workshop Final Report a predatory journal?

PubScope has no integrity flags on record for IEEE International Integrated Reliability Workshop Final Report: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of IEEE International Integrated Reliability Workshop Final Report?

IEEE International Integrated Reliability Workshop Final Report is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.18.

Is IEEE International Integrated Reliability Workshop Final Report indexed in Scopus and Web of Science?

IEEE International Integrated Reliability Workshop Final Report is indexed in Scopus.

What is the aims and scope of IEEE International Integrated Reliability Workshop Final Report?