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IEEE International Integrated Reliability Workshop Final Report

Institute of Electrical and Electronics Engineers Inc. · United States · Est. 2006

ISSN2374-8036

SJR -✓ Scopus / SJR

/ 100

High Risk

Score Breakdown

No verified metrics

Total0

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Score

0.165

H-Index

Total Works

Total Citations

203

2yr Mean Citedness

0.00

Free JIF alternative

Aims & Scope✦ Inferred from recent articles

This journal focuses on the reliability of semiconductor devices, investigating wearout mechanisms, degradation, and failure prediction under various electrical and environmental stresses. Research includes analysis of thin film resistors, transistors (NMOS, PMOS, MOSFETs, HBTs, LFNDMOS), SONOS devices, high-k dielectrics, and electrically programmable fuses. Methodologies involve accelerated stress testing, self-heating characterization, charge pumping, current-voltage measurements, and atomic force microscopy to understand and improve device lifetime and performance.

AI-summarised from recent articles · verify on the publisher page

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

SJR Rank

Bottom 25%

General Information

Country / RegionUnited States

Primary Language—

1st Year Published2006

Annual Volume~ 44 articles / year

StatusActive (last: 2006)

Total Publications44

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

2374-8036

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Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

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Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringUnranked

Electronic, Optical and Magnetic MaterialsUnranked

Safety, Risk, Reliability and QualityUnranked

Subject Classification

Scopus Categories

Electrical and Electronic EngineeringSafety, Risk, Reliability and QualityElectronic, Optical and Magnetic Materials

Research Topics (OpenAlex)

Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure AnalysisCopper Interconnects and ReliabilityFerroelectric and Negative Capacitance DevicesSilicon Carbide Semiconductor TechnologiesAdvanced Memory and Neural ComputingThin-Film Transistor TechnologiesSemiconductor materials and interfacesElectrostatic Discharge in Electronics