Home›Search›IEEE International Reliability Physics Symposium Proceedings

IEEE International Reliability Physics Symposium Proceedings

Institute of Electrical and Electronics Engineers Inc. · United States · Est. 2009

ISSN1541-7026

SJR -✓ Scopus / SJR

/ 100

High Risk

Score Breakdown

No verified metrics

Total0

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Score

0.477

H-Index

SNIP

1.022

Total Works

Total Citations

1,134

2yr Mean Citedness

0.00

Free JIF alternative

Aims & Scope✦ Inferred from recent articles

This journal focuses on the reliability of semiconductor devices and integrated circuits. It covers topics such as device degradation mechanisms, failure analysis, and reliability testing under various stress conditions. Specific areas include memory devices (SRAM, DRAM, NAND flash, NOR flash, T-RAM), transistors (MOSFETs, HBTs), and interconnects. The journal also addresses the impact of process technologies, materials, and environmental factors on device reliability.

AI-summarised from recent articles · verify on the publisher page

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

SJR Rank

Bottom 25%

General Information

Country / RegionUnited States

Primary Language—

1st Year Published2009

Annual Volume~ 67 articles / year

StatusActive (last: 2009)

Total Publications67

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

Institute of Electrical and Electronics Engineers Inc.

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

1541-7026

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Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

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Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Engineering (miscellaneous)Unranked

Subject Classification

Scopus Categories

Engineering (miscellaneous)

Research Topics (OpenAlex)

Semiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure AnalysisCopper Interconnects and ReliabilityRadiation Effects in ElectronicsFerroelectric and Negative Capacitance DevicesElectronic and Structural Properties of OxidesElectronic Packaging and Soldering TechnologiesAdvanced Memory and Neural ComputingElectrostatic Discharge in Electronics