HomeIEEE International Conference on Microel…Similar Journals
🔗 Semantic Similarity · SPECTER2 Embeddings

Journals Similar to

IEEE International Conference on Microelectronic Test Structures

Institute of Electrical and Electronics Engineers Inc. · United States

20 journals ranked by semantic similarity to scope and research topics

#1

Advancing Microelectronics

IMAPS-International Microelectronics and Packaging Society · United States

SJR Q4Scopus
0.109SJR
58
Trust
#2

Microelectronics Reliability

Elsevier Ltd · United Kingdom

SJR Q2SCIEScopus
0.464SJR
90
Trust
#3

IEEE Transactions on Device and Materials Reliability

Institute of Electrical and Electronics Engineers Inc. · United States

SJR Q2SCIEScopus
0.451SJR
4.9CiteScore
$2,800APC
90
Trust
#4

IEEE Workshop on Microelectronics and Electron Devices, WMED

Institute of Electrical and Electronics Engineers Inc. · United States

Scopus
0.125SJR
20
Trust
#5

IEEE International Integrated Reliability Workshop Final Report

Institute of Electrical and Electronics Engineers Inc. · United States

Scopus
0.18SJR
20
Trust
#6

IEEE International Reliability Physics Symposium Proceedings

Institute of Electrical and Electronics Engineers Inc. · United States

Scopus
0.461SJR
20
Trust
#7

IEEE Transactions on Components, Packaging and Manufacturing Technology

Institute of Electrical and Electronics Engineers Inc. · United States

SJR Q1SCIEScopus
0.763SJR
90
Trust
#8

Proceedings of the Austrian Workshop on Microelectronics, Austrochip

Institute of Electrical and Electronics Engineers Inc. · United States

SJR Q3Scopus
0.273SJR
54
Trust
#9

Solid-State Electronics

Elsevier Ltd · United Kingdom

SJR Q3SCIEScopus
0.335SJR
90
Trust
#10

IEEE Journal of the Electron Devices Society

Institute of Electrical and Electronics Engineers Inc. · United States

SJR Q2SCIEScopusDOAJ
0.506SJR
5CiteScore
$1,350APC
96
Trust
#11

Journal of Microelectronic Manufacturing

JommPublish · United States

DOAJ
$0APC
52
Trust
#12

Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Institute of Electrical and Electronics Engineers Inc. · United States

Scopus
0.182SJR
20
Trust
#13

Conference Proceedings from the International Symposium for Testing and Failure Analysis

ASM International · United States

Scopus
0.118SJR
20
Trust
#14

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

ESD Association · United States

Scopus
0.27SJR
52
Trust
#15

IEEE Transactions on Electron Devices

Institute of Electrical and Electronics Engineers Inc. · United States

SJR Q1SCIEScopus
0.809SJR
90
Trust
#16

IEEE Electrical Design of Advanced Packaging and Systems Symposium

Institute of Electrical and Electronics Engineers Inc. · United States

Scopus
0.194SJR
20
Trust
#17

Proceedings of the IEEE/CPMT International Electronics Manufacturing Technology (IEMT) Symposium

Institute of Electrical and Electronics Engineers Inc. · United States

Scopus
0.121SJR
20
Trust
#18

IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings

Institute of Electrical and Electronics Engineers Inc. · United States

Scopus
0.264SJR
20
Trust
#19

Microelectronics International

Emerald Group Publishing Ltd. · United Kingdom

SJR Q3SCIEScopus
0.218SJR
90
Trust
#20

Experience of Designing and Application of CAD Systems in Microelectronics

Institute of Electrical and Electronics Engineers Inc. · United States

SJR Q4Scopus
0.151SJR
46
Trust
← Back to Journal⚖️ Compare This Journal