Home›Search›Proceedings of the IEEE VLSI Test Symposium

Proceedings of the IEEE VLSI Test Symposium

IEEE Computer Society · United States · Est. 2007

ISSN2375-1053

SJR -✓ Scopus / SJR

/ 100

High Risk

Score Breakdown

No verified metrics

Total0

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Score

0.43

H-Index

SNIP

1.029

Total Works

Total Citations

2,156

2yr Mean Citedness

0.00

Free JIF alternative

Aims & Scope✦ Inferred from recent articles

This journal focuses on the testing and diagnosis of integrated circuits and systems. It covers methodologies for generating test patterns, detecting various types of defects (e.g., opens, delay faults, parametric faults), and improving test efficiency. The scope also includes built-in self-test (BIST) techniques, fault diagnosis, and the impact of process variations and nanometer technologies on testing.

AI-summarised from recent articles · verify on the publisher page

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

SJR Rank

Bottom 25%

General Information

Country / RegionUnited States

Primary Language—

1st Year Published2007

Annual Volume~ 49 articles / year

StatusActive (last: 2008)

Total Publications97

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

IEEE Computer Society

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Does the journal have a website?

No URL

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Is the ISSN verified?

2375-1053

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Indexed in a trusted database?

Scopus

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Peer review process documented?

N/A

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Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

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Not on predatory/blacklists?

✓ Clean

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Long-term digital preservation?

N/A

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Plagiarism detection in place?

N/A

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Listed in DOAJ (verified OA)?

N/A

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Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Computer Science ApplicationsUnranked

Electrical and Electronic EngineeringUnranked

Subject Classification

Scopus Categories

Computer Science ApplicationsElectrical and Electronic Engineering

Research Topics (OpenAlex)

VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in ElectronicsLow-power high-performance VLSI designVLSI and FPGA Design TechniquesSemiconductor materials and devicesAdvancements in Photolithography TechniquesAdvancements in Semiconductor Devices and Circuit DesignAdvancements in PLL and VCO TechnologiesRadio Frequency Integrated Circuit Design