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Proceedings of the IEEE VLSI Test Symposium

IEEE Computer Society · United States · Est. 2007

ISSN2375-1053

✓ Scopus / SJR

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.394

H-Indexi

SNIPi

1.029

Total Worksi

Total Citationsi

2,156

2yr Mean Citednessi

0.00

Open Impact Factor alternative

Aims & Scope

Subject areas: Computer Science Applications; Electrical and Electronic Engineering.

General Information

Country / RegionUnited States

Primary Language—

1st Year Published2007

Annual Volume~ 49 articles / year

StatusActive (last: 2008)

Total Publications97

Publisher OrgInstitute of Electrical and Electronics Engineers

Submission Info

Peer Review—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/11 · 36%

✅

Do you know the journal / publisher?

IEEE Computer Society

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

2375-1053

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

A twelfth criterion — whether APC fees are clearly disclosed — is not scored here; it is left out of the total rather than counted as a failure. Publication charges appear in the metrics card above.

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Computer Science ApplicationsUnranked

Electrical and Electronic EngineeringUnranked

Subject Classification

Scopus Categories

Computer Science ApplicationsElectrical and Electronic Engineering

Research Topics (OpenAlex)

VLSI and Analog Circuit TestingIntegrated Circuits and Semiconductor Failure AnalysisRadiation Effects in ElectronicsLow-power high-performance VLSI designVLSI and FPGA Design TechniquesSemiconductor materials and devicesAdvancements in Photolithography TechniquesAdvancements in Semiconductor Devices and Circuit DesignAdvancements in PLL and VCO TechnologiesRadio Frequency Integrated Circuit Design

Frequently asked questions about Proceedings of the IEEE VLSI Test Symposium

Is Proceedings of the IEEE VLSI Test Symposium a predatory journal?

PubScope has no integrity flags on record for Proceedings of the IEEE VLSI Test Symposium: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of Proceedings of the IEEE VLSI Test Symposium?

Proceedings of the IEEE VLSI Test Symposium is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.394.

Is Proceedings of the IEEE VLSI Test Symposium indexed in Scopus and Web of Science?

Proceedings of the IEEE VLSI Test Symposium is indexed in Scopus.

What is the aims and scope of Proceedings of the IEEE VLSI Test Symposium?