Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.
SJR Score
0.131
H-Index
8
SNIP
0.114
Total Works
491
Total Citations
379
2yr Mean Citedness
0.18
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Aims & Scope✦ Inferred from recent articles
This journal focuses on the analysis of electronic device failures, encompassing methodologies, technologies, and strategies for identifying root causes and improving reliability. It covers advanced techniques for fault isolation, defect detection, and characterization of semiconductor devices, including integrated circuits, advanced packaging, and photonic devices. The scope also includes the development of tools and roadmaps for failure analysis and the impact of industry initiatives on the semiconductor field.
AI-summarised from recent articles · verify on the publisher page
⚡ Speed vs Prestige
How does this journal balance review speed with impact level?
Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.
Publication & Citation Trend
Articles published
Times cited
2019
2020
2021
2022
2023
2024
2025
2026
Source: OpenAlex · Note: citations accumulate over time so older years appear higher
SJR Quartile by Discipline
Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.
Electrical and Electronic EngineeringQ4
Safety, Risk, Reliability and QualityQ4
Subject Classification
Scopus Categories
Electrical and Electronic EngineeringSafety, Risk, Reliability and Quality
Research Topics (OpenAlex)
Integrated Circuits and Semiconductor Failure AnalysisElectron and X-Ray Spectroscopy TechniquesVLSI and Analog Circuit TestingSemiconductor materials and devicesIndustrial Vision Systems and Defect DetectionAdvanced Surface Polishing TechniquesForce Microscopy Techniques and Applications3D IC and TSV technologiesIon-surface interactions and analysisPhysical Unclonable Functions (PUFs) and Hardware Security