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Electronic Device Failure Analysis

ASM International · United States · Est. 1998

ISSN1537-0755

SJR Q4✓ Scopus / SJR

/ 100

Established

PubScope credibility score from verifiable indexing & ethics signals

Score Breakdown

◆ Scopus Q446

Total46

Third-party records · how this is calculated · Report an error →

⚡ Speed vs Prestige

How does this journal balance review speed with impact level?

Publication speed: not measurable

publisher doesn’t disclose per-article submission dates — we never estimate

SJR Rank

Bottom 25%

Journal Impact Factor

Not on record at PubScope. The Journal Impact Factor is published by Clarivate for Web of Science (JCR)–indexed journals.

SJR Scorei

0.112

H-Indexi

SNIPi

0.114

Total Worksi

491

Total Citationsi

379

2yr Mean Citednessi

0.18

Open Impact Factor alternative

Aims & Scope

Subject areas: Electrical and Electronic Engineering; Safety, Risk, Reliability and Quality.

General Information

Country / RegionUnited States

Primary Language—

1st Year Published1998

Annual Volume~ 20 articles / year

StatusActive (last: 2025)

Total Publications491

Publisher OrgASM International

Submission Info

Peer Review—

Review Time—

Acceptance Rate—

OA License—

OA Rate—

Ethics & Quality

COPE Member✗ No

OASPA Member✗ No

Not on Predatory Lists✓ Yes

Think.Check.Submit Compliance

thinkchecksubmit.org

4/12 · 33%

✅

Do you know the journal / publisher?

ASM International

❌

Does the journal have a website?

No URL

✅

Is the ISSN verified?

1537-0755

✅

Indexed in a trusted database?

Scopus

❌

Peer review process documented?

N/A

❌

Follows ethical publishing standards (COPE)?

N/A

❌

APC fees clearly disclosed?

N/A

✅

Not on predatory/blacklists?

✓ Clean

❌

Long-term digital preservation?

N/A

❌

Plagiarism detection in place?

N/A

❌

Listed in DOAJ (verified OA)?

N/A

❌

Primary language documented?

N/A

Based on the Think.Check.Submit framework by DOAJ, COPE & OASPA. All data from verified open sources.

Publication & Citation Trend

Articles published

Citations received

2019

2020

2021

2022

2023

2024

2025

2026

Source: OpenAlex · Each year’s green bar = citations earned by that year’s papers, counted to date — so recent years look lower simply because their papers haven’t had time to be cited yet.

SJR Quartile by Discipline

Scimago ranks this journal separately in each subject category — its quartile can differ by discipline.

Electrical and Electronic EngineeringQ4

Safety, Risk, Reliability and QualityQ4

Subject Classification

Scopus Categories

Electrical and Electronic EngineeringSafety, Risk, Reliability and Quality

Research Topics (OpenAlex)

Integrated Circuits and Semiconductor Failure AnalysisElectron and X-Ray Spectroscopy TechniquesVLSI and Analog Circuit TestingSemiconductor materials and devicesIndustrial Vision Systems and Defect DetectionAdvanced Surface Polishing TechniquesForce Microscopy Techniques and Applications3D IC and TSV technologiesIon-surface interactions and analysisPhysical Unclonable Functions (PUFs) and Hardware Security

Frequently asked questions about Electronic Device Failure Analysis

Is Electronic Device Failure Analysis a predatory journal?

PubScope has no integrity flags on record for Electronic Device Failure Analysis: it is indexed in Scopus, and is not on DOAJ's withdrawn list. Its PubScope Trust Score is 46/100. Indexing is a transparency signal, not a guarantee — always confirm fit and policies before submitting.

What is the impact factor of Electronic Device Failure Analysis?

Electronic Device Failure Analysis is not in the Web of Science Core Collection, so it has no official Clarivate Journal Impact Factor. Its SCImago SJR score is 0.112.

Is Electronic Device Failure Analysis indexed in Scopus and Web of Science?

Electronic Device Failure Analysis is indexed in Scopus.

What is the aims and scope of Electronic Device Failure Analysis?